Proceedings : First Asian Test Symposium (ATS'92), November 26-27, 1992, Hiroshima, Japan

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Proceedings : First Asian Test Symposium (ATS'92), November 26-27, 1992, Hiroshima, Japan / sponsored by IEEE Computer Society Test Technology Technical Committee

資料種別:

図書

出版情報:

Los Alamitos, CA : IEEE Computer Society Press, 1992

形態:

x, 259 p. ; 28 cm

著者名:

ISBN:

9780818629853 [0818629851]
9780818629860 [081862986X] (: microfiche)
9780818629877 [0818629878] (: hard)

書誌ID:

BA20318312

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

その他の標題:	ATS '92 Proceedings
注記:	"IEEE Computer Society Press order number 2985." "IEEE Catalog Number 92TH0458-0" Includes bibliographies and index
主題:	Automatic test equipment--Congresses; Integrated circuits--Testing--Congresses
言語:	英語

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