所蔵情報QRコード
X ray and optical emission analysis of high-temperature alloys : a symposium presented at the sixty-seventh annual meeting, American Society for Testing and Materials, Chicago, Ill., June 23, 1964 / ASTM Committee E-2 on Emission Spectroscopy ; American Society for Testing and Materials
- 資料種別:
- 図書
- 出版情報:
- Philadelphia : ASTM, c1965
- 形態:
- vi, 43 p. ; 23 cm
- シリーズ名:
- ASTM special technical publication ; no. 376 <BA00068096>
- 著者名:
- 書誌ID:
- BA20490686
類似資料:
American Society for Testing and Materials | |
American Society for Testing Materials | |
American Society for Testing Materials | |