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Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A. / editors, David K. Biegelsen, David J. Smith, S.Y. Tong

資料種別:
図書
出版情報:
Pittsburgh, Pa. : Materials Research Society, 1993
形態:
ix, 288 p. ; 24 cm
シリーズ名:
Materials Research Society symposium proceedings ; v. 295 <BA00013775>
著者名:
ISBN:
9781558991903 [1558991905]
書誌ID:
BA20587802
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