ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993 : proceedings

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ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993 : proceedings / sponsored by the IEEE Computer Society in cooperation with EUREL

資料種別:

図書

出版情報:

Los Alamitos, Calif. : IEEE Computer Society Press, c1993

形態:

xvi, 548 p. ; 28 cm

著者名:

ISBN:

9780818633607 [0818633603] (: paper)
9780818633614 [0818633611] (: microfiche)

書誌ID:

BA20852732

子書誌情報

フルテキスト

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書誌詳細

注記:	Includes bibliographical references and index
主題:	Automatic checkout equipment--Congresses; Integrated circuits--Testing--Congresses
言語:	英語

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