Proceedings : International Test Conference 1993

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Proceedings : International Test Conference 1993 / [sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]

資料種別:

図書

出版情報:

Altoona, PA : International Test Conference, c1993

形態:

xii, 1065 p. ; 29 cm

著者名:

ISBN:

9780780314290 [0780314298] (: soft)
9780780314306 [0780314301] (: case)

書誌ID:

BA2136134X

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

その他の標題:	Designing, testing, and diagnostics - join them 1993 IEEE International Test Conference ITC : International Test Conference 1993
注記:	At head of title: ITC : International Test Conference 1993 "October 17-21, 1993, Convention Center, Baltimore, Maryland, USA"--Cover "IEEE Catalog Number 93CH3356-3."--T.p. verso Includes bibliographies and index
主題:	Automatic checkout equipment--Congresses; Integrated circuits--Testing--Congresses
言語:	英語

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