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Proceedings : International Test Conference 1993 / [sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]

資料種別:
図書
出版情報:
Altoona, PA : International Test Conference, c1993
形態:
xii, 1065 p. ; 29 cm
著者名:
ISBN:
9780780314290 [0780314298] (: soft)
9780780314306 [0780314301] (: case)
書誌ID:
BA2136134X
子書誌情報
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