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Selected papers on speckle metrology / Rajpal S. Sirohi, editor

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE Optical Engineering Press, c1991
形態:
xviii, 668 p. ; 28 cm
シリーズ名:
SPIE milestone series / Brian J. Thompson, general editor ; v. MS 35 <BA10810973>
著者名:
ISBN:
9780819406385 [0819406384]
9780819406392 [0819406392]
書誌ID:
BA23355268
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