Advances in optical metrology : August 28-29, 1978, San Diego, California

>> Google Books

所蔵情報QRコード

Advances in optical metrology : August 28-29, 1978, San Diego, California / N. Balasubramanian, James C. Wyant, editors

資料種別:

図書

出版情報:

Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, c1978

形態:

vi, 166 p. (p. 166 blank) ; 28 cm

シリーズ名:

Proceedings of the Society of Photo-Optical Instrumentation Engineers ; v. 153 <BA0118856X>

著者名:

ISBN:

9780892521807 [0892521805]

書誌ID:

BA23922823

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

注記:	Includes bibliographical references and indexes
主題:	Optical measurements--Congresses
言語:	英語

東工大ブックレビュー

類似資料:

1 図書 Precision surface metrology : August 23-24, 1983, San Diego, California (pbk.) Wyant, James C., Society of Photo-optical Instrumentation Engineers S.P.I.E.-- International Society for Optical Engineering	7 図書 Polarization science and remote sensing III : 29-30 August 2007, San Diego, California, USA Polarization Science and Remote Sensing, Shaw, Joseph A., Tyo, J. Scott, Society of Photo-optical Instrumentation … SPIE
2 図書 Optical testing and metrology III : recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California (: pt. 1 ; : pt. 2) Grover, C. P., Society of Photo-optical Instrumentation Engineers, International Symposium on Optical and Optoelectronic … SPIE	8 図書 Optical diagnostics : 3-4 August, 2005, San Diego, California, USA Hanssen, Leonard M., Farrell, Patrick V., Society of Photo-optical Instrumentation Engineers SPIE
3 図書 Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA Assoufid, Lahsen, Takacs, Peter Z., Taylor, J. S. (John S.), Society of Photo-optical Instrumentation Engineers SPIE	9 図書 Recent developments in optical gauge block metrology : 20-21 July 1998, San Diego, California Decker, Jennifer E., Brown, Nicholas, Society of Photo-optical Instrumentation Engineers SPIE
4 図書 Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA Assoufid, Lahsen, Takacs, Peter Z., Ohtsuka, Masaru, Society of Photo-optical Instrumentation Engineers SPIE	10 図書 Photometric engineering of sources and systems : 29-30 July 1997, San Diego, California Arecchi, Angelo V., Society of Photo-optical Instrumentation Engineers SPIE
5 図書 Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, Duparré, Angela, Singh, Bhanwar, … SPIE	11 図書 Optical diagnostics for fluids, solids, and combustion II : 3-4 August, 2003, San Diego, California, USA Farrell, Patrick V., Society of Photo-optical Instrumentation Engineers SPIE
6 図書 Two- and three-dimensional methods for inspection and metrology VI : 10-11 August 2008, San Diego, California, USA Huang, Peisen S., Yoshizawa, Toru, Harding, Kevin G., Society of Photo-optical Instrumentation Engineers SPIE	12 図書 Recent developments in traceable dimensional measurements II : 4-6 August, 2003, San Diego, California, USA Decker, Jennifer E., Brown, Nicholas, Society of Photo-optical Instrumentation Engineers SPIE

1

2

3

4

5

6

7

8

9

10

11

12