Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California

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Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California / D.E. Aspnes, S. So, R.F. Potter, editors

資料種別:

図書

出版情報:

Bellingham, Wash. : S.P.I.E.-- Society of Photo-optical Instrumentation Engineers, 1981

形態:

x, 262 p. ; 28 cm

シリーズ名:

Proceedings of the Society of Photo-Optical Instrumentation Engineers ; v. 276 <BA0118856X>

著者名:

ISBN:

9780892523092 [0892523093] (pbk.)

書誌ID:

BA23923983

子書誌情報

フルテキスト

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書誌詳細

注記:	Includes bibliographical references and indexes
主題:	Semiconductors--Testing--Optical methods--Congresses
言語:	英語

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