Applications of optical metrology : techniques and measurements II : [proceedings] : April 7-8, 1983, Arlington, Virginia

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Applications of optical metrology : techniques and measurements II : [proceedings] : April 7-8, 1983, Arlington, Virginia / chairman/editor: John J. Lee, Jr

資料種別:

図書

出版情報:

Bellingham, Wash. : S.P.I.E.-- International Society for Optical Engineering, c1983

形態:

vi, 214 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 416 <BA0022700X>

著者名:

ISBN:

9780892524518 [0892524510] (pbk.)

書誌ID:

BA23957828

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

注記:	Includes bibliographical references and index
主題:	Optical measurements--Congresses
言語:	英語

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