Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California

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Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California / cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors

資料種別:

図書

出版情報:

Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1985

形態:

vi, 198 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 525 <BA0022700X>

著者名:

ISBN:

9780892525607 [0892525606] (pbk.)

書誌ID:

BA23996502

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

注記:	Includes bibliographies and index
主題:	Lenses--Defects--Congresses
言語:	英語

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