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X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California / Thomas W. Rusch, chairman/editor ; cooperating organizations, Institute of Optics/University of Rochester ... [et al.]

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1986
形態:
vi, 156 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 690 <BA0022700X>
著者名:
ISBN:
9780892527250 [0892527250] (pbk.)
書誌ID:
BA24030633
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