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X-ray imaging II : 21-22 August 1986, San Diego, California / Larry V. Knight, D. Keith Bowen, chairmen/editors ; cooperating organizations, Institute of Optics/University of Rochester ... [et al.]

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1986
形態:
vi, 149 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 691 <BA0022700X>
著者名:
ISBN:
9780892527267 [0892527269] (pbk.)
書誌ID:
BA24031170
子書誌情報
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