Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts / Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center
- 資料種別:
- 図書
- 出版情報:
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987
- 形態:
- vi, 256 p. ; 28 cm
- シリーズ名:
- Proceedings / SPIE -- the International Society for Optical Engineering ; v. 730 <BA0022700X>
- 著者名:
- ISBN:
- 9780892527656 [089252765X] (pbk.)
- 書誌ID:
- BA24042031
類似資料:
SPIE--International Society for Optical Engineering | |
SPIE--the International Society for Optical Engineering | |