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Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts / Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987
形態:
vi, 256 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 730 <BA0022700X>
著者名:
ISBN:
9780892527656 [089252765X] (pbk.)
書誌ID:
BA24042031
子書誌情報
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