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Automated inspection and high speed vision architectures : 3-4 November, 1987, Cambridge, Massachusetts / Michael J.W. Chen, Rolf-Juergen Ahlers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing/Carnegie Mellon University ... [et al.]

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1988
形態:
vi, 274 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 849 <BA0022700X>
著者名:
ISBN:
9780892528844 [0892528842]
書誌ID:
BA24066630
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