Test and evaluation of infrared detectors and arrays : 27-29 March 1989, Orlando, Florida | 東京工業大学附属図書館蔵書検索

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Test and evaluation of infrared detectors and arrays : 27-29 March 1989, Orlando, Florida / Forney M. Hoke ; sponsored by SPIE -- the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c1989

形態:

vi, 306 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1108 <BA0022700X>

著者名:

ISBN:

9780819401441 [0819401447]

書誌ID:

BA24257242

子書誌情報

フルテキスト

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所蔵情報

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他の版・巻

書誌詳細

注記:	Includes bibliographical references and index
言語:	英語

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