Surface characterization and testing II : 10-11 August 1989, San Diego, California

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Surface characterization and testing II : 10-11 August 1989, San Diego, California / John E. Greivenkamp, Matt Young, chairs/editors

資料種別:

図書

出版情報:

Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1989

形態:

vi, 271 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1164 <BA0022700X>

著者名:

ISBN:

9780819402004 [0819402001]

書誌ID:

BA24342953

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

注記:	"Sponsored by SPIE--the International Society for Optical Engineering." Includes bibliographical references and index
主題:	Surfaces (Technology)--Optical properties--Congresses; Surfaces (Technology)--Testing--Congresses
言語:	英語

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