Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts | 東京工業大学附属図書館蔵書検索

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Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts / Shekhar G. Wadekar, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c1990

形態:

vi, 196 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1180 <BA0022700X>

著者名:

ISBN:

9780819402165 [0819402168]

書誌ID:

BA24456293

子書誌情報

フルテキスト

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所蔵情報

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他の版・巻

書誌詳細

注記:	Includes bibliographical references and index
言語:	英語

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