Blank Cover Image
所蔵情報QRコード

Optical testing and metrology III : recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California / C.P. Grover, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE, c1990
形態:
2 v. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1332 <BA0022700X>
著者名:
ISBN:
9780819403933 [0819403938] (: pt. 1)
9780819403933 [0819403938] (: pt. 2)
書誌ID:
BA25651443
子書誌情報
Loading
フルテキスト
Loading contents information
所蔵情報
Loading availability information
他の版・巻

類似資料:

Grover, C. P., Society of Photo-optical Instrumentation Engineers, Engineering Society of Detroit

SPIE

Wyant, James C., Society of Photo-optical Instrumentation Engineers

S.P.I.E.-- International Society for Optical Engineering

Assoufid, Lahsen, Takacs, Peter Z., Taylor, J. S. (John S.), Society of Photo-optical Instrumentation Engineers

SPIE

Grover

SPIE Digital Library Proceedings

Assoufid, Lahsen, Takacs, Peter Z., Ohtsuka, Masaru, Society of Photo-optical Instrumentation Engineers

SPIE

Huang, Peisen S., Yoshizawa, Toru, Harding, Kevin G., Society of Photo-optical Instrumentation Engineers

SPIE

Decker, Jennifer E., Brown, Nicholas, Society of Photo-optical Instrumentation Engineers

SPIE

Tobin, Kenneth W., IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation …

SPIE

Decker, Jennifer E., Peng, Gwo-Sheng, Society of Photo-optical Instrumentation Engineers

SPIE

Cha, Soyoung S., Trolinger, James D., Society of Photo-optical Instrumentation Engineers

SPIE

Pryputniewicz, Ryszard J., Brown, Gordon M., Jüptner, Werner P. O., Society of Photo-optical Instrumentation Engineers, …

SPIE

Cha, Soyoung S., Trolinger, Jim, 川橋, 正昭, Society of Photo-optical Instrumentation Engineers

SPIE

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12