Laser testing and reliability : 7 November 1991, San Jose, California | 東京工業大学附属図書館蔵書検索

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Laser testing and reliability : 7 November 1991, San Jose, California / David L. Begley, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c1992

形態:

v, 104 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1620 <BA0022700X>

著者名:

ISBN:

9780819407580 [0819407585]

書誌ID:

BA25851067

子書誌情報

フルテキスト

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書誌詳細

注記:	Includes bibliographical references and index
主題:	Semiconductor lasers--Reliability--Congresses; Semiconductor lasers--Testing--Congresses
言語:	英語

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