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13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section

資料種別:
図書
出版情報:
Los Alamitos, Calif. : IEEE Computer Society Press, c1995
形態:
xx, 493 p. ; 28 cm
著者名:
ISBN:
9780818670008 [0818670002] (pbk.)
書誌ID:
BA25972389
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The Society : Institute of Electrical and Electronics Engineers

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