1995 IEEE International Reliability Physics Proceedings : 33rd annual, Las Vegas, Nevada, April 4, 5, 6, 1995 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
- 資料種別:
- 図書
- 出版情報:
- Piscataway : Institute of Electrical and Electronics Engineers, c1995
- 形態:
- vii, 405 p. ; 28 cm
- 著者名:
- ISBN:
- 9780780320314 [078032031X] (: soft.)
9780780320321 [0780320328] (: case.)
9780780320338 [0780320336] (: micro.) - 書誌ID:
- BA26091774
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