>> Google Books
所蔵情報QRコード

Machine vision applications in character recognition and industrial inspection : 10-12 February 1992, San Jose, California / Donald P. D'Amato ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, IS&T--the Society for Imaging Science and Technology

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c1992
形態:
vii, 431 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1661 <BA0022700X>
著者名:
ISBN:
9780819408150 [0819408158]
書誌ID:
BA26379502
子書誌情報
Loading
フルテキスト
Loading contents information
所蔵情報
Loading availability information
他の版・巻

類似資料:

D'Amato, Donald P., Society of Photo-optical Instrumentation Engineers, IS&T--the Society for Imaging Science and …

SPIE

Vincent, Luc M., Baird, Henry S., IS&T--the Society for Imaging Science and Technology, Society of Photo-optical …

SPIE

Wu, Frederick Y., Dawson, Benjamin M., IS&T--the Society for Imaging Science and Technology, Society of Photo-optical …

SPIE

Document Recognition and Retrieval, Lin, Xiaofan, Yanikoglu, Berrin A., IS&T--the Society for Imaging Science and …

SPIE, IS&T

Wilson, Stephen S., Wu, Frederick Y., IS&T--the Society for Imaging Science and Technology, Society of Photo-optical …

SPIE

Vincent, Luc M., Hull, Jonathan J., IS & T--the Society for Imaging Science and Technology, Society of Photo-optical …

SPIE

Vincent, Luc M., Hull, Jonathan J., IS&T--the Society for Imaging Science and Technology, Society of Photo-optical …

SPIE

Niel, Kurt S., Fofi, David, IS&T--the Society for Imaging Science and Technology, Society of Photo-optical …

SPIE, IS&T

Vincent, Luc M., Pavlidis, Theodosios, IS&T--the Society for Imaging Science and Technology, Society of Photo-optical …

SPIE

Lopresti, Daniel Philip, Zhou, Jiangying, IS & T--the Society for Imaging Science and Technology, Society of …

SPIE

Dawson, Benjamin M., Wilson, Stephen S., Wu, Frederick Y., IS&T--the Society for Imaging Science and Technology, Society …

SPIE

Postek, Michael T., Society of Photo-optical Instrumentation Engineers, SPIE Conference on Integrated Circuit Metrology, …

SPIE

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12