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Interferometry : surface characterization and testing : 24 July 1992, San Diego, California / Katherine Creath, John E. Greivenkamp, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c1992
形態:
vii, 184 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1776 <BA0022700X>
著者名:
ISBN:
9780819409492 [0819409499]
書誌ID:
BA26570074
子書誌情報
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