Microelectronics manufacturing and reliability : 21-22 September 1992, San Jose, California | 東京工業大学附属図書館蔵書検索

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Microelectronics manufacturing and reliability : 21-22 September 1992, San Jose, California / Barbara Vasquez ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c1993

形態:

x, 258 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1802 <BA0022700X>

著者名:

ISBN:

9780819410009 [0819410004]

書誌ID:

BA26603220

子書誌情報

フルテキスト

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所蔵情報

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他の版・巻

書誌詳細

注記:	Includes bibliographical references and index
主題:	Integrated circuits--Design and construction--Congresses; Integrated circuits--Testing--Congresses
言語:	英語

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