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Microelectronics manufacturing and reliability : 21-22 September 1992, San Jose, California / Barbara Vasquez ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c1993
形態:
x, 258 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1802 <BA0022700X>
著者名:
ISBN:
9780819410009 [0819410004]
書誌ID:
BA26603220
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