>> Google Books
所蔵情報QRコード

Submicrometer metallization : the challenges, opportunities, and limitations : 23-25 September 1992, San Jose, California / Thomas Kwok, Takamaro Kikkawa, Krishna Shenai, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c1993
形態:
ix, 344 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1805 <BA0022700X>
著者名:
ISBN:
9780819410030 [0819410039]
書誌ID:
BA26610816
子書誌情報
Loading
フルテキスト
Loading contents information
所蔵情報
Loading availability information

類似資料:

Bondur, James, Society of Photo-optical Instrumentation Engineers

SPIE

International Conference of Microelectronics, Sowiński, Andrzej, Institute of Electrical and Electronics Engineers. …

SPIE

Gildenblat, Gennady Sh., Schwartz, Gary P., Society of Photo-optical Instrumentation Engineers

SPIE

Hoang, Hoang H., Society of Photo-optical Instrumentation Engineers

SPIE

Vasquez, Barbara, Society of Photo-optical Instrumentation Engineers

SPIE

NATO Advanced Research Workshop on Metallization and Metal-Semiconductor Interfaces, Batra, Inder P., North Atlantic …

Plenum Press

Design and Process Integration for Microelectronic Manufacturing (Conference), Wong, Alfred Kwok-Kit, Singh, Vivek K., …

SPIE

Bondur, James, Society of Photo-optical Instrumentation Engineers

SPIE

Davis, Cecil J., Herman, Irving P., Turner, Terry R., Society of Photo-optical Instrumentation Engineers

SPIE

SPIE Digital Library Proceedings

Design and Process Integration for Microelectronic Manufacturing (Conference), Liebmann, Lars W., Society of …

SPIE

Symposium on Electromigration of Metals, International Symposium on Multilevel Metallization and Packaging, Lloyd, J. R. …

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12