>> Google Books
所蔵情報QRコード

Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman

資料種別:
図書
出版情報:
Piscataway, NJ : IEEE Press
New York : Institute of Electrical and Electronics Engineers, c1990
形態:
xvii, 652 p. ; 26 cm
著者名:
ISBN:
9780780310629 [0780310624]
書誌ID:
BA27278679
子書誌情報
Loading
フルテキスト
Loading contents information
所蔵情報
Loading availability information

類似資料:

Breuer, Melvin A., Friedman, Arthur D.

Computer Science Press

Breuer, Melvin A., Preiss, Ralph J.

Prentice-Hall

Breuer, Melvin A.

Prentice-Hall

Friedman, Arthur D., Menon, Premachandran R.

Prentice-Hall

Friedman, Arthur D.

Computer Science Press

Breuer, Melvin A., 林, 孝雄

産業図書

Cavin, Ralph K., 1939-, Liu, Wentai, 1948-, International Symposium on Circuits and Systems

Available from IEEE Operations Center

Esrig, Melvin I., Bachus, Robert C. (Robert Charles), 1951-

ASTM

IFIP WG 10.5 International Workshop on Knowledge Based Systems for Test and Diagnosis, Saucier, Gabrièle, Ambler, …

North-Holland

Hall, Arthur D. (Arthur David)

Van Nostrand

Breuer, Melvin A., Preiss, Ralph J.

Prentice-Hall

Langer, Arthur M.

Springer eBooks Computer Science, Springer London

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12