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Machine vision applications in industrial inspection II : 8-9 February 1994, San Jose, California / Benjamin M. Dawson, Stephen S. Wilson, Frederick Y. Wu, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE, c1994
形態:
ix, 336 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2183 <BA0022700X>
著者名:
ISBN:
9780819414786 [0819414786] (pbk.)
書誌ID:
BA2739602X
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