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Annual Reliability and Maintainability Symposium : 1996 proceedings : Las Vegas, Nevada USA, 1996 January 22-25 / Reliability and Maintainability Symposium

資料種別:
図書
出版情報:
[New York] : Institute of Electrical and Electronics Engineers, c1996
形態:
xx, 359, 83 p. ; 28 cm
著者名:
Reliability and Maintainability Symposium <DA01815564>  
ISBN:
9780780331129 [0780331125] (: soft.)
9780780331136 [0780331133] (: case.)
9780780331143 [0780331141] (: micro.)
書誌ID:
BA27563063
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