Proceedings : International Test Conference 1995 | 東京工業大学附属図書館蔵書検索

>> Google Books

所蔵情報QRコード

Proceedings : International Test Conference 1995 / International Test Conference

資料種別:: 図書
出版情報:: Altoona, PA : International Test Conference, c1995
形態:: xii, 1011 p. ; 29 cm
著者名:: International Test Conference <DA0261156X>
ISBN:: 9780780329911 [0780329910] (: soft)
9780780329928 [0780329929] (: case)
9780780329935 [0780329937] (: microfiche)
書誌ID:: BA27728210

子書誌情報

フルテキスト

Loading contents information

所蔵情報

Loading availability information

他の版・巻

書誌詳細

その他の標題:	1995 IEEE International Test Conference ITC : International Test Conference 1995 95CB35858 95CH35858
注記:	"IEEE Catalog Number 95CH35858." Includes bibliographies and index
主題:	Automatic checkout equipment--Congresses; Integrated circuits--Testing--Congresses
言語:	英語

東工大ブックレビュー

Loading review information

類似資料:

1 図書 Proceedings : International Test Conference 1999 (: soft ; : case ; : microfiche) International Test Conference, IEEE Computer Society International Test Conference	7 図書 Proceedings : International Test Conference 1993 (: soft ; : case) International Test Conference, IEEE Computer Society International Test Conference
2 図書 Proceedings : International Test Conference 1997 (: soft - :CD-ROM) International Test Conference, IEEE Computer Society International Test Conference	8 図書 New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC (paper ; microfiche ; case) International Test Conference, IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and … Computer Society Press of the IEEE
3 図書 Proceedings : International Test Conference 1998 (: soft ; : case ; : microfiche) International Test Conference, IEEE Computer Society International Test Conference	9 図書 International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA International Test Conference, IEEE Computer Society. Test Technology Technical Council, Institute of Electrical and … International Test Conference
4 図書 Proceedings : International Test Conference 1996 (: soft - :CD-ROM) International Test Conference, IEEE Computer Society International Test Conference	10 図書 International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA International Test Conference, IEEE Computer Society. Test Technology Technical Council, Institute of Electrical and … International Test Conference
5 図書 Proceedings : International Test Conference 1994 (: soft ; : case) International Test Conference International Test Conference	11 図書 Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, … (pbk. ; microfiche ; case) International Test Conference, IEEE Computer Society, Institute of Electrical and Electronics Engineers. Philadelphia … Computer Society Press of the IEEE, Order from Computer Society of the IEEE
6 図書 Proceedings : International Test Conference 1992 (: soft. ; : case. ; : micro.) International Test Conference International Test Conference	12 図書 Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] (: soft ; : case ; : microfiche) International Test Conference, IEEE Computer Society, IEEE Computer Society. Test Technology Technical Council, … International Test Conference

1

2

3

4

5

6

7

8

9

10

11

12