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Conference Record : AUTOTESTCON '96, September 16-19, 1996, Dayton, Ohio : "Test technology and commercialization" / sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society

資料種別:
図書
出版情報:
Piscataway : IEEE Service Center, c1996
形態:
488 p. ; 28 cm
著者名:
ISBN:
9780780333796 [0780333799] (: soft.)
9780780333802 [0780333802] (: case.)
書誌ID:
BA28696936
子書誌情報
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