Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California | 東京工業大学附属図書館蔵書検索

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Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California / edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits Council

資料種別:

図書

出版情報:

Los Alamitos, Calif. : IEEE Computer Society Press, c1995

形態:

ix, 129 p. ; 28 cm

著者名:

IEEE International Workshop on Memory Testing <DA09002934>

Rajsuman, Rochit <DA06745397>

Rajkanan, K. (Kamal) <DA10226076>

IEEE Computer Society. Test Technology Technical Committee <DA03323957>

IEEE Computer Society. Technical Committee on VLSI <DA04967445>

IEEE Solid-State Circuits Council <DA02621632>

さらに 1 件

ISBN:

9780818671029 [0818671025]

書誌ID:

BA28718416

子書誌情報

フルテキスト

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所蔵情報

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他の版・巻

書誌詳細

その他の標題:	95TH8065
注記:	"IEEE catalog number 95TH8065"--T.p. verso Includes bibliographical references and index
主題:	Random access memory--Congresses; Semiconductor storage devices--Testing--Congresses
言語:	英語

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