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1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

資料種別:
図書
出版情報:
Piscataeay, N.J. : IEEE Service Center, c1996
形態:
vi, 172 p. ; 28 cm
著者名:
ISBN:
9780780327054 [0780327055]
書誌ID:
BA28812028
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