Transmission electron microscopy : a textbook for materials science

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Transmission electron microscopy : a textbook for materials science / David B. Williams and C. Barry Carter

資料種別:

図書

出版情報:

New York : Plenum Press, 1996

形態:

xxvii, 729 p. ; 29 cm

著者名:

ISBN:

9780306452475 [0306452472] (: Hardbound)
9780306453243 [030645324X] (pbk.)

書誌ID:

BA28971790

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

注記:

Includes bibliographical references and index

主題:

Materials--Microscopy; Transmission electron microscopy

言語:

英語

目次情報:

Basics

The Transmission Electron Microscope / 1：

Scattering and Diffraction / 2：

Elastic Scattering / 3：

Inelastic Scattering and Beam Damage / 4：

Electron Sources / 5：

Lenses, Apertures, and Resolution / 6：

How to `See' Electrons / 7：

Pumps and Holders / 8：

The Instrument / 9：

Specimen Preparation. Diffraction / 10：

Diffraction Patterns / 11：

Thinking in Reciprocal Space / 12：

Diffracted Beams / 13：

Bloch Waves / 14：

Dispersion Surfaces / 15：

Diffraction from Crystals / 16：

Diffraction from Small Volumes / 17：

Indexing Diffraction Patterns / 18：

Kikuchi Diffraction / 19：

Obtaining CBED Patterns / 20：

Using Covergent-Beam Technologies. Imaging / 21：

Imaging in the TEM / 22：

Thickness and Bending Effects / 23：

Planar Defects / 24：

Strain Fields / 25：

WeakBeam Dark-Field Microscopy / 26：

Phase-Contrast Images / 27：

High-Resolution TEM / 28：

Image Simulation / 29：

Quantifying and Processing HRTEM Images / 30：

Other Imaging Techniques. Spectrometry / 31：

Xray Spectrometry / 32：

The XEDS-TEM Interface / 33：

Qualitative Xray Analysis / 34：

Quantitative Xray Microanalysis / 35：

Spatial Resolution and Minimum Detectability / 36：

Electron EnergyLoss Spectrometers / 37：

The EnergyLoss Spectrum / 38：

Microanalysis with Ionization-Loss Electrons / 39：

Everything Else in the Spectrum / 40：

Index

Basics

The Transmission Electron Microscope / 1：

Scattering and Diffraction / 2：

Elastic Scattering / 3：

Inelastic Scattering and Beam Damage / 4：

Electron Sources / 5：

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類似資料:

1 図書 Practical analytical electron microscopy in materials science (: Germany ; : us ; : pbk) Williams, David B. (David Bernard), 1949- Verlag Chemie International, Electron Optics Pub. Co.	7 図書 Fundamentals of high-resolution transmission electron microscopy 堀内, 繁雄 North-Holland
2 電子ブック Transmission Electron Microscopy Carter, C. Barry;Williams, David B., Williams, David B. SpringerLink Books - AutoHoldings, Springer International Publishing	8 図書 Materials problem solving with the transmission electron microscope : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A. Hobbs, Linn W., Westmacott, K. H. (Kenneth H.), Williams, David B. (David Bernard), 1949-, Materials Research Society, … Materials Research Society
3 図書 Images of materials Williams, David B. (David Bernard), 1949-, Pelton, Alan R., Gronsky, R. (Ronald) Oxford University Press	9 図書 Electron microscopy 1990 : proceedings of the 12th International Congress for Electron Microscopy held in Seattle, Washington, USA, 12-18 August 1990 : 48th … (v. 1 - v. 4) International Congress on Electron Microscopy, Peachey, L. D., Williams, David B. (David Bernard), 1949- San Francisco Press
4 図書 Impact of electron and scanning probe microscopy on materials research (: pbk) Rickerby, David G., Valdrè, Giovanni, Valdrè, U. (Ugo) Kluwer Academic	10 図書 Optical microscopy of materials (pbk.) Haynes, R. (Raymond), 1927- International Textbook Co.
5 図書 High-resolution imaging and spectrometry of materials Ernst, F. (Frank), 1938-, Rühle, M. (Manfred) Springer	11 図書 Scanning probe microscopy techniques Bhushan, Bharat, 1949-, Fuchs, H. (Harald), 河田, 聡 Springer
6 図書 Transmission electron microscopy : physics of image formation and microanalysis Reimer, Ludwig, 1928- Springer	12 図書 Transmission electron microscopy of materials Thomas, Gareth, Goringe, M. J. Wiley