Introduction to X-ray powder diffractometry

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Introduction to X-ray powder diffractometry / Ron Jenkins, Robert L. Snyder

資料種別:

図書

出版情報:

New York : J. Wiley, c1996

形態:

xxiii, 403 p. ; 24 cm

シリーズ名:

Chemical analysis ; v. 138 <BA00071272>

著者名:

ISBN:

9780471513391 [0471513393]

書誌ID:

BA29184088

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

注記:

"A Wiley-Interscience publication."
Includes index

主題:

Powders--Optical properties--Measurement; X-ray diffractometer; X-rays--Diffraction--Technique

言語:

英語

目次情報:

Characteristics of X-Radiation

The Crystalline State

Diffraction Theory

Sources for the Generation of X-Radiation

Detectors and Detection Electronics

Production of Monochromatic Radiation

Instruments for the Measurement of Powder Patterns

Alignment and Maintenance of Powder Diffractometers

Specimen Preparation

Acquisition of Diffraction Data

Reduction of Data from Automated Powder Diffractometers

Qualitative Analysis

Quantitative Analysis

Appendices

Index

Characteristics of X-Radiation

The Crystalline State

Diffraction Theory

Sources for the Generation of X-Radiation

Detectors and Detection Electronics

Production of Monochromatic Radiation

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