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Proceedings, 15th IEEE VLSI Test Symposium : April 27-May 1, 1997, Monterey, California / sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section

資料種別:
図書
出版情報:
Los Alamitos, Calif. : IEEE Computer Society Press, c1997
形態:
xxxii, 466 p. ; 28 cm
著者名:
ISBN:
9780818678103 [0818678100] (: pbk)
書誌ID:
BA33983755
子書誌情報
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