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Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A. / editors, J. Joseph Clement ... [et al.]

資料種別:
図書
出版情報:
Pittsburgh, Pa. : Materials Research Society, c1997
形態:
xv, 457 p. ; 24 cm
シリーズ名:
Materials Research Society symposium proceedings ; v. 473 <BA00013775>
著者名:
Clement, J. Joseph  
ISBN:
9781558993778 [1558993770]
書誌ID:
BA34715569
子書誌情報
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