Practical applications of infrared thermal sensing and imaging equipment

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Practical applications of infrared thermal sensing and imaging equipment / Herbert Kaplan

資料種別:: 図書
出版情報:: Bellingham, Wash. : SPIE Optical Engineering Press, c1993
形態:: xiv, 137 p. ; 26 cm
シリーズ名:: Tutorial texts in optical engineering ; v. TT 13 <BA11743995>
著者名:: Kaplan, Herbert <DA08736251>
ISBN:: 9780819412072 [0819412074]
書誌ID:: BA35859520

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主題:

Infrared technology; Thermography

言語:

英語

目次情報:

Preface

Basics and Instrument Overview / Part I：

Introduction / Chapter 1：

The Reasons for Using Infrared Instruments / 1.1：

Advantages of Noncontact Thermal Measurement / 1.2：

Some Historical Background / 1.3：

An Overview of This Text / 1.4：

Basics of Noncontact Thermal Measurements / Chapter 2：

Heat Transfer and Radiation Exchange Basics / 2.1：

Heat and Temperature / 2.1.1：

Converting Temperature Units / 2.1.2：

The Three Modes of Heat Transfer / 2.1.3：

Conduction / 2.1.4：

Convection / 2.1.5：

Radiation / 2.1.6：

Radiation Exchange at the Target Surface / 2.1.7：

Specular and Diffuse Surfaces / 2.1.8：

Transient Heat Exchange / 2.1.9：

The Infrared Measurement Problem / 2.2：

Noncontact Thermal Measurements / 2.2.1：

The Target Surface / 2.2.2：

The Transmitting Medium / 2.2.3：

The Measuring Instrument / 2.2.4：

Introduction to Thermal Scanning and Imaging Instruments / 2.3：

Line Scanning / 2.3.1：

Two-dimensional Scanning / 2.3.2：

Multidetector Scanners and SPRITE Technology / 2.3.3：

Infrared Focal Plane Array (IRFPA) Imagers / 2.3.4：

Pyroelectric Vidicon Thermal Imagers / 2.3.5：

Matching the Instrument to the Application / Chapter 3：

Point-Sensing Instruments / 3.1：

Scanners and Imagers--Qualitative and Quantitative / 3.2：

Performance Parameters of Imaging Radiometers / 3.2.1：

Thermal Imaging Software / 3.3：

Overview of Instruments / Chapter 4：

Introduction and Classification of Instruments / 4.1：

Instrument Manufacturers / 4.2：

Discussion of Instruments / 4.3：

Point Sensors (Radiation Thermometers) / 4.3.1：

Infrared Thermocouples and Probes / 4.3.1.1：

Portable Hand-held Group / 4.3.1.2：

On-line Monitoring and Control / 4.3.1.3：

Special / 4.3.1.4：

Line Scanners / 4.3.2：

Portable Line Scanner / 4.3.2.1：

On-line (Monitoring and Control) Line Scanners / 4.3.2.2：

Thermographic / 4.3.3：

Mechanically Scanned Thermal Viewers / 4.3.3.1：

Electronically Scanned Thermal Viewers (Pyrovidicon Imagers) / 4.3.3.2：

"Staring" FPA Thermal Viewers (Qualitative) / 4.3.3.3：

Thermographic Raster Scanners (Imaging Radiometers) / 4.3.3.4：

FPA Imaging Radiometers (Quantitative) / 4.3.3.5：

Thermal Imaging Diagnostic Software / 4.4：

Quantitative Thermal Measurements of Targets / 4.4.1：

Detailed Processing and Image Diagnostics / 4.4.2：

Image Recording, Storage and Recovery / 4.4.3：

Image Comparison / 4.4.4：

Report and Database Preparation / 4.4.5：

Recording, Hard Copy and Storage of Images and Data / 4.5：

Using Ir Sensing and Imaging Instruments / Chapter 5：

Introduction: The Thermal Behavior of the Target / 5.1：

Emissivity Difference / 5.1.1：

Reflectance Difference / 5.1.2：

Transmittance Difference / 5.1.3：

Geometric Difference / 5.1.4：

Mass Transport Difference / 5.1.5：

Phase-change Difference / 5.1.6：

Thermal Capacitance Difference / 5.1.7：

Induced Heating Difference / 5.1.8：

Energy Conversion Difference / 5.1.9：

Direct Heat Transfer Difference / 5.1.10：

Learning about the Target Environment / 5.1.11：

Preparation of Equipment for Operation / 5.2：

Calibration / 5.2.1：

Checking Calibration / 5.2.1.1：

Transfer Calibration / 5.2.1.2：

The Equipment Checklist / 5.2.2：

Equipment Checkout and Calibration / 5.2.3：

Batteries / 5.2.4：

Avoiding Common Mistakes in Instrument Operation / 5.3：

Start-up Procedure / 5.3.1：

Memorizing the Default Values / 5.3.2：

Setting the Correct Emissivity / 5.3.3：

Filling the IFOV meas for Accurate Temperature Measurements / 5.3.4：

Aiming Normal to the Target Surface / 5.3.5：

Recognizing and Avoiding Reflections from External Sources / 5.3.6：

Avoiding Radiant Heat Damage to the Instrument / 5.3.7：

Instrument Applications / Part II：

Introduction to Applications / Chapter 6：

Plant Condition Monitoring and Predictive Maintenance / Chapter 7：

Electrical / 7.1：

High Electrical Resistance / 7.2.1：

Short Circuits / 7.2.2：

Open Circuits / 7.2.3：

Inductive Currents / 7.2.4：

Energized Grounds / 7.2.5：

Condition Guidelines / 7.2.6：

Mechanical / 7.3：

Friction / 7.3.1：

Valve or Pipe Blockage/Leakage / 7.3.2：

Insulation within the Plant or Facility / 7.3.3：

Miscellaneous Applications / 7.4：

Rebar Location / 7.4.1：

Condenser Air In-leakage / 7.4.2：

Containment Spray Ring Headers / 7.4.3：

Hydrogen Igniters / 7.4.4：

Effluent Thermal Plumes / 7.4.5：

Buildings and Infrastructure / Chapter 8：

Measuring Insulating Properties / 8.1：

Considering the Total Structure / 8.3：

Industrial Roof Moisture Detection / 8.4：

Thermographic Inspection of Our Aging Infrastructure / 8.5：

Materials Testing / Chapter 9：

Materials Testing--Infrared Nondestructive Testing / 9.1：

Failure Modes and Establishment of Acceptance Criteria / 9.2：

Selecting the IR Imaging System / 9.3：

Pulsed Heat Injection Applications / 9.4：

Boiler Tube Corrosion Thinning Assessment / 9.4.1：

Infrastructure NDT / 9.5：

Product and Process Monitoring and Control / Chapter 10：

The Evolution of Noncontact Process Control / 10.1：

Full Image Process Monitoring / 10.2：

Product Monitoring of Semiconductors / 10.3：

Steel Wire Drawing Machine Monitoring / 10.4：

Full Image Process Control / 10.5：

Closing the Loop--Examples / 10.6：

Night Vision, Security and Surveillance / Chapter 11：

Nonmilitary Applications / 11.1：

Aerial and Ground (Sea) Based Search and Rescue / 11.2.1：

Firefighting / 11.2.2：

Space and Airborne Reconnaissance / 11.2.3：

Police Surveillance and Crime Detection and Security / 11.2.4：

Drivers' Aid Night Vision / 11.2.5：

Commercial Instrument Performance Characteristics / Appendix A：

Manufacturers of Ir Sensing and Imaging Instruments / Appendix B：

Generic Emissivities of Materials / Appendix C：

Preface

Basics and Instrument Overview / Part I：

Introduction / Chapter 1：

The Reasons for Using Infrared Instruments / 1.1：

Advantages of Noncontact Thermal Measurement / 1.2：

Some Historical Background / 1.3：

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