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Proceedings, 16th IEEE VLSI Test Symposium : April 26-30, 1998, Monterey, California / sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section

資料種別:
図書
出版情報:
Los Alamitos, Calif. : IEEE Computer Society, c1998
形態:
xxxx, 472 p. ; 28 cm
著者名:
ISBN:
9780818684364 [0818684364]
書誌ID:
BA37201717
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