Defect recognition and image processing in semiconductors 1997 : proceedings of the Seventh International Conference on Defect Recognition and Image Porcessing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September, 1997 | 東京工業大学附属図書館蔵書検索

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Defect recognition and image processing in semiconductors 1997 : proceedings of the Seventh International Conference on Defect Recognition and Image Porcessing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September, 1997 / edited by J. Donecker and I. Rechenberg

資料種別:

図書

出版情報:

Bristol : Institute of Physics, c1998

形態:

xx, 524 p. ; 24 cm

シリーズ名:

Institute of Physics conference series ; no. 160 <BA00171324>

著者名:

ISBN:

9780750305006 [0750305002]

書誌ID:

BA37250687

子書誌情報

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書誌詳細

注記:	Includes bibliographical references and index
主題:	Image processing--Congresses; Semiconductors--Defects--Congresses
言語:	英語

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