Recombination lifetime measurements in silicon | 東京科学大学図書館　蔵書検索（大岡山図書館、すずかけ台図書館）

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Recombination lifetime measurements in silicon / Dinesh C. Gupta, Fred R. Bacher, and William H. Hughes, editors

資料種別:

図書

出版情報:

W. Conshohocken, PA : ASTM, c1998

形態:

392 p. ; 24 cm

シリーズ名:

ASTM special technical publication ; 1340 <BA00068096>

著者名:

ISBN:

9780803124899 [0803124899]

書誌ID:

BA38492284

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注記:	Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997 Includes bibliographical references and index
主題:	Electronic measurements--Congresses; Semiconductors--Testing--Congresses; Service life (Engineering)--Forecasting--Congresses
言語:	英語

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