Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A. | 東京工業大学附属図書館蔵書検索

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Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A. / editors, John C. Bravman ... [et al.]

資料種別:: 図書
出版情報:: Pittsburgh, Pa. : Materials Research Society, c1998
形態:: xi, 365 p. ; 24 cm
シリーズ名:: Materials Research Society symposium proceedings ; v. 516 <BA00013775>
著者名:: Bravman, AJohm C.
ISBN:: 9781558994225 [155899422X]
書誌ID:: BA38805823

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注記:	Includes index
主題:	Electrodiffusion--Congresses; Microelectronics--Materials--Testing--Congresses; Microelectronics--Reliability--Congresses; Microstructure--Congresses
言語:	英語

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