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Proceedings : International Test Conference 1998 / [sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]

資料種別:
図書
出版情報:
Washington, D.C. : International Test Conference, c1998
形態:
xvi, 1179 p. ; 29 cm
著者名:
ISBN:
9780780350922 [0780350928] (: soft)
9780780350939 [0780350936] (: case)
9780780350946 [0780350944] (: microfiche)
書誌ID:
BA39741282
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