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Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland / Maksymilian Pluta, Tomasz R. Woliński, chairs/editors ; Mariusz Szyjer, co-editor ; organized by, SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland)

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE, c1997
形態:
xviii, 374 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3094 <BA0022700X>
著者名:
Pluta, Maksymilian
Woliński, Tomasz R.
Szyjer, Mariusz
Society of Photo-optical Instrumentation Engineers. Poland Chapter
Institute of Applied Optics (Poland)
Komitet Badań Naukowych (Poland)
Society of Photo-optical Instrumentation Engineers
さらに 2 件
ISBN:
9780819425096 [0819425095]
書誌ID:
BA41023758
子書誌情報
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