Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG | 東京工業大学附属図書館蔵書検索

>> Google Books

所蔵情報QRコード

Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG / Christophe Gorecki, chair/editor ; sponsored by EOS--The European Optical Society, SPIE--The International Society for Optical Engineering, the Commission of the European Communities, Directorate General for Science, Research, and Development

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c1997

形態:

xii, 846 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3098 <BA0022700X>
Proceedings EurOpt series <BA31190072>

著者名:

ISBN:

9780819425188 [0819425184]

書誌ID:

BA41040790

子書誌情報

フルテキスト

Loading contents information

所蔵情報

Loading availability information

他の版・巻

書誌詳細

その他の標題:	Optical inspection and micromeasurements 2 Optical inspection and micromeasurements two
注記:	Includes bibliographical references and index
主題:	Engineering inspection--Industrial applications--Congresses; Interferometry--Congresses; Optical detectors--Industrial applications--Congresses; Optical measurements--Industrial applications--Congresses
言語:	英語

東工大ブックレビュー

Loading review information

類似資料:

1 図書 Optical inspection and micromeasurements : 10-14 June 1996, Besançon, France Gorecki, Christophe, Centre national de la recherche scientifique (France) SPIE--International Society for Optical Engineering	7 図書 Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany (: pt. 1) Optical Measurement Systems for Industrial Inspection, Osten, Wolfgang, Gorecki, Christophe, Novak, Erik L., SPIE … SPIE
2 図書 Microsystems engineering : metrology and inspection : 20-21 June 2001, Munich, Germany (pbk.) Gorecki, Christophe, Jüptner, Werner P. O., Kujawińska, Małgorzata, European Optical Society, Wissenschaftliche … SPIE	8 図書 Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany (: pt. 2) Optical Measurement Systems for Industrial Inspection, Osten, Wolfgang, Gorecki, Christophe, Novak, Erik L., SPIE … SPIE
3 図書 Microsystems engineering : metrology and inspection III : 23-25 June, 2003, Munich, Germany Gorecki, Christophe, European Optical Society, Wissenschaftliche Gesellschaft Lasertechnik, Society of Photo-optical … SPIE	9 図書 Sensors and control for automation : 22-24 June, Frankfort, FRG Becker, Markus, Daniel, R. W. (Ron W.), Loffeld, Otmar, Commission of the European Communities. Directorate-General for … SPIE--the International Society for Optical Engineering
4 図書 Microsystems metrology and inspection : 15-16 June 1999, Munich, Germany Gorecki, Christophe, European Optical Society, Society of Photo-optical Instrumentation Engineers SPIE	10 図書 Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China Yeh, Sheng-hua, 1934-, Society of Photo-optical Instrumentation Engineers, Chinese Optical Society, Chinese Optics & … SPIE
5 図書 Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG Loffeld, Otmar, Society of Photo-optical Instrumentation Engineers, European Optical Society, Commission of the European … SPIE	11 図書 Recent developments in traceable dimensional measurements : 20-21 June 2001, Munich, Germany Decker, Jennifer E., Brown, Nicholas, Society of Photo-optical Instrumentation Engineers, European Optical Society, … SPIE
6 図書 Optical measurements and sensors for the process industries : 20-22 June 1994, Frankfurt, FRG Gorecki, Christophe, Preater, Richard W. T., Commission of the European Communities. Directorate-General for Science, … SPIE--the International Society for Optical Engineering	12 図書 Optical micro- and nanometrology in manufacturing technology : 29-30 April, 2004, Strasbourg, France Gorecki, Christophe, Asundi, Anand, Society of Photo-optical Instrumentation Engineers SPIE

1

2

3

4

5

6

7

8

9

10

11

12