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1998 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference : test technology for the 21st century / sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Los Angels Council

資料種別:
図書
出版情報:
Piscataway, NJ : IEEE Service Center, c1998
形態:
xxvi, 669 p. ; 28 cm
著者名:
ISBN:
9780780344204 [0780344200] (: soft.)
9780780344211 [0780344219] (: case.)
書誌ID:
BA41661175
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