1998 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference : test technology for the 21st century

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1998 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference : test technology for the 21st century / sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Los Angels Council

資料種別:

図書

出版情報:

Piscataway, NJ : IEEE Service Center, c1998

形態:

xxvi, 669 p. ; 28 cm

著者名:

ISBN:

9780780344204 [0780344200] (: soft.)
9780780344211 [0780344219] (: case.)

書誌ID:

BA41661175

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

その他の標題:	1998 IEEE AUTOTESTCON 98CH36179
ISSN:	10887725
注記:	"IEEE catalog no. 98CH36179"
主題:	Automatic checkout equipment--Congresses; Electronics in aeronatics--Congresses; Maintainabillty (Engineering)--Congresses
言語:	英語

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