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Proceedings, 17th IEEE VLSI Test Symposium : April 25-29, 1999, Dana Point, California / sponsored by IEEE Computer Society Test Technology Technical Council

資料種別:
図書
出版情報:
Los Alamitos, Calif. ; Tokyo : IEEE Computer Society, c1999
形態:
xxxii, 488 p. ; 28 cm
著者名:
ISBN:
9780769501468 [076950146X]
書誌ID:
BA41906090
子書誌情報
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