Near-field nano-optics : from basic principles to nano-fabrication and nano-photonics

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Near-field nano-optics : from basic principles to nano-fabrication and nano-photonics / Motoichi Ohtsu and Hirokazu Hori

資料種別:

図書[東工大目次DB]

出版情報:

New York : Kluwer Academic/Plenum Pub., c1999

形態:

xii, 386 p. ; 24 cm

シリーズ名:

Lasers, photonics, and electro-optics <BA22750755>

著者名:

ISBN:

9780306458972 [0306458977]

書誌ID:

BA42551274

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

注記:

Includes bibliographical references index

著者名ヨミ:

オオツ, モトイチ
ホリ, ヒロカズ

主題:

Nanostructure materials; Near-field microscopy; Photonics; Quantum optics

言語:

英語

目次情報:

Chapter 1. Introduction

1.1. Near-Field Optics and Photonics 1

1.1.1. Optical Processes and Electromagnetic Interactions 1

1.2. Ultra-High-Resolution Near-Field Optical Microscopy (NOM) 4

1.2.1. From Interference-to Interaction-Type Optical Microscopy 4

1.2.2. Development of Near-Field Optical Microscopy and Related Techniques 6

1.3. General Features of Optical Near-Field Problems 10

1.3.1. Optical Processes and the Scale of Interest 10

1.3.2. Effective Fields and Interacting Subsystems 12

1.3.3. Electromagnetic Interaction in a Dielectric System 15

1.3.4. Optical Near-Field Measurements 20

1.4. Theoretical Treatment of Optical Near-Field Problems 25

1.4.1. Near-Field Optics and Inhomogeneous Waves 25

1.4.2. Field-Theoretic Treatment of Optical Near-Field Problems 28

1.4.3. Explicit Treatment of Field-Matter Interaction 32

1.5. Remarks on Near-Field Optics and Outline of This Book 33

1.5.1. Near-Field Optics and Related Problems 33

1.5.2. Outline of This Book 34

1.6. References 35

Chapter 2. Principles of Near-Field Optical Microscopy

2.1. An Example of Near-Field Optical Microscopy 43

2.2. Construction of the NOM System 45

2.2.1. Building Blocks of the NOM System 45

2.2.2. Environmental Conditions 47

2.2.3. Functions of the Building Blocks 48

2.3. Theoretical Description of Near-Field Optical Microscopy 50

2.3.1. Basic Character of the NOM Process 50

2.3.3. Demonstration of Localization in the Near-Field Interaction 53

2.3.4. Representation of the Spatial Localization of an Electromagnetic Event 55

2.3.5. Model Description of a Local Electromagnetic Interaction 55

2.4. Near-Field Problems and the Tunneling Process 56

2.4.1. Bardeen's Description of Tunneling Current in STM 57

2.4.2. Comparison of the Theoretical Aspects of NOM and STM 58

2.5. References 61

Chapter 3. Instrumentation

3.1. Basic Systems of a Near-Field Optical Microscope 63

3.1.1. Modes of Operation 66

3.1.2. Position Control of the Probe 69

3.1.3. Mechanical Components 74

3.1.4. Noise Sources Internal to the NOM 75

3.1.5. Operation under Special Circumstances 78

3.2. Light Sources 82

3.2.1. Basic Properties of Lasers 82

3.2.2. Characteristics of CW Lasers 84

3.2.3. Additional Noise Properties of CW Lasers 88

3.2.4. Short-Pulse Generation 94

3.2.5. Nonlinear Optical Wavelength Conversion 97

3.3. Light Detection and Signal Amplification 98

3.3.1. Detector 98

3.3.2. Signal Detection and Amplification 103

3.4. References 111

Chapter 4. Fabrication of Probes

4.1. Sharpening of Fibers by Chemical Etching 113

4.1.1. A Basic Sharpened Fiber 114

4.1.2. A Sharpened Fiber with Reduced-Diameter Cladding 118

4.1.3. A Pencil-Shaped Fiber 119

4.1.4. A Flattened-Top Fiber 122

4.1.5. A Double-Tapered Fiber 127

4.2. Metal Coating and Fabrication of a Protruded Probe 130

4.2.1. Removal of Metallic Film by Selective Resin Coating 132

4.2.2. Removal of Metallic Film by Nanometric Photolithography 135

4.3. Other Noverl Probes 139

4.3.1. Functional Probes 139

4.3.2. Optically Trapped Probes 141

4.4. References 141

Chapter 5. Imaging Experiments

5.1. Basic Features of the Localized Evanescent Field 143

5.1.1. Size-Dependent Decay Length of the Field Intensity 143

5.1.2. Manifestation of the Short-Range Electromagnetic Interaction 146

5.1.3. High Discrimination Sensitivity of the Evanescent Field Intensity Normal to the Surface 149

5.2. Imaging Biological Samples 152

5.2.1. Imaging by the C-Mode 152

5.2.2. Imaging by the I-Mode 161

5.3. Spatial Power Spectral Analysis of the NOM Image 170

5.4. References 177

Chapter 6. Diagnostics and Spectroscopy of Photonic Devices and Materials

6.1. Diagnosing a Dielectric Optical Waveguide 179

6.2. Spatially Resolved Spectroscopy of Lateral p-n Junctions in Silicon-Doped Gallium Arsenide 184

6.2.1. Photoluminescence and Electroluminescence Spectroscopy 185

6.2.2. Photocurrent Measurement by Multiwavelength NOM 191

6.3. Photoluminescence Spectroscopy of a Semiconductor Quantum Dot 196

6.4. Imaging of Other Materials 201

6.4.1. Fluorescence Detection from Dye Molecules 201

6.4.2. Spectroscopy of Solid-State Materials 205

6.5. References 207

Chapter 7. Fabrication and Manipulation

7.1. Fabrication of Photonic Devices 209

7.1.1. Development of a High-Efficiency Probe 212

7.1.2. Development of a Highly Sensitive Storage Medium 212

7.1.3. Fast Scanning of the Probe 213

7.2. Manipulating Atoms 213

7.2.1. Zero-Dimensional Manipulation 214

7.2.2. One-Dimensional Manipulation 216

7.3. References 231

Chapter 8. Optical Near-Field Theory

8.1. Introduction 235

8.2. Electromagnetic Theory as the Basis of Treating Near-Field Problems 237

8.2.1. Microscopic Electromagnetic Interaction and Averaged Field 237

8.2.2. Optical Response of Macroscopic Matter 241

8.2.3. Optical Response of Small Objects and the Idea of System Susceptibility 244

8.2.4. Electromagnetic Boundary Value Problem 245

8.3. Optical Near-Field Theory as an Electromagnetic Scattering Problem 255

8.3.1. Self-Consistent Approach for Multiple Scattering Problems 255

8.3.2. Scattering Theory in the Near-Field Regime Based on Polarization Potential and Magnetic Current 260

8.4. Diffraction Theory in Near-Field Optics 275

8.4.1. Diffraction of Light from Subwavelength Aperture 275

8.4.2. Kirchhoff's Diffraction Integral and Far-Field Theory 276

8.4.3. Small-Aperture Diffraction and Equivalent Problem 277

8.4.4. Magnetic Current Distribution and Self-Consistency 278

8.4.5. Leviatan's "Exact" Solutions for the Aperture Problem 280

8.5. Institutive Model of Optical Near-Field Processes 281

8.5.1. Short-Range Quasistatic Nature of Optical Near-Field Processes 281

8.5.2. Intuitive Model Based on Yukawa-Type Screened Potential 282

8.5.3. Application of Virtual Photon Model for Diffraction from a Small Aperture 285

8.5.4. Virtual Photon Model of NOM 288

8.5.5. Meaning of the Screened Potential Model and Physical Meaning of the Virtual Photon 292

8.6. References 297

Chapter 9. Theoretical Description of Near-Field Optical Microscope

9.1. Electromagnetic Processes Involved in the Near-Field Optical Microscope 300

9.2. Representation of the Electromagnetic Field and the Interaction Propagator 302

9.2.1. Spherical Representation of Scalar Waves 302

9.2.2. Vector Nature of the Electromagnetic Field 307

9.3. States of Vector Fields and Their Representations 316

9.3.1. State of Vector Plane Waves 316

9.3.2. State of Vector Spherical Waves 318

9.3.3. State of Vector Cylindrical Waves 319

9.3.4. Spatial Fourier Representation of Electromagnetic Fields 319

9.3.5. Multipole Expansion of Vector Plane Waves 321

9.4. Angular Spectrum Representation of Electromagnetic Interactions 324

9.4.1. Angular Spectrum Representation of Scattering Problems 325

9.4.2. Meaning of the Angular Spectrum Representation 327

9.4.3. Angular Spectrum Representation of Scalar Multipole Field and Propagator 329

9.4.4. Angular Spectrum Representation of Vector Multipole Field and Propagator 332

9.4.5. Angular Spectrum Representation of Cylindrical Field and Propagator 340

9.4.6. Transformation between Spherical and Cylindrical Representations 341

9.4.7. Summary: Representations of the Electromagnetic Fields Transformations between Mode Functions 343

9.5. Near-Field Interaction of Dielectric Spheres Near a Planar Dielectric Surface 347

9.5.1. Sample-Probe Interaction at a Dielectric Surface 348

9.5.2. Mode Description of Evanescent Waves of Fresnel 351

9.5.3. Multipolar Representation of Evanescent Modes 352

9.5.4. Near-Field Interaction of Dielectric Spheres at a Planar Dielectric Surface 359

9.6. References 379

Index 381

Chapter 1. Introduction

1.1. Near-Field Optics and Photonics 1

1.1.1. Optical Processes and Electromagnetic Interactions 1

1.2. Ultra-High-Resolution Near-Field Optical Microscopy (NOM) 4

1.2.1. From Interference-to Interaction-Type Optical Microscopy 4

1.2.2. Development of Near-Field Optical Microscopy and Related Techniques 6

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